X-ray microscopy : proceedings of the sixth international confernce Berkeley CA 2-6 August 1999
| Author(s) : | Attwood David T., Meyer-Ilse Werner., Warwick Tony., |
| Publisher : | Melville, N.Y. :American Institute of Physics |
| Publication Date : | 2000 |
| ISSN : | 1563969262 |
| Location : | Main, |
| Call Number : | QH212.X73 2000 |
